Ensuring fast, accurate, and comprehensive testing of the optical properties of Photonic Integrated Circuits (PICs) is crucial for minimizing prototyping time and costs and accelerating product introduction to the market. Luna Innovations offers cutting-edge optical frequency domain reflectometry (OFDR) based test and measurement solutions that can characterize modern PIC-based devices with high speed and reliability. The OVA 5100 can provide precise measurements in reflection or transmission modes within seconds, capturing loss, polarization, dispersion, phase, and time domain response simultaneously. The new Lightwave Component Analyzer, LWA 7601-C, offers rapid testing capabilities with a 12.5 Hz acquisition speed. Luna's products can be seamlessly integrated into PIC manufacturing lines, allowing for full automation with alignment probe stations at wafer and chip levels. Join us to explore the solutions that meet your optical testing needs.
Ricardo Arias is a telecommunication engineer from the University of Zaragoza (Spain) and joined Luna Europe sales team in 2023 as field application engineer. Ricardo has more than 10 years of experience in technical sales of high-performance optical test and measurement laboratory and field instrumentation for telecom and sensing markets. Among the main products and technologies, he’s worked with high resolution optical spectrum analysis for advanced modulated signals or passive devices characterization, optical time and frequency domain reflectometry and high-definition distributed fiber optic sensing.